Skills you will gain
- 3D IC Packaging Fundamentals ¨C Understand key concepts, benefits, and challenges of 3D IC technology.
- Advanced Packaging Techniques ¨C Explore architectures, materials, and fabrication processes.
- Physical Verification & EMIR ¨C Learn chip stacking verification and power integrity analysis.
- Industry Trends & Innovations ¨C Stay ahead with emerging technologies in 3D IC packaging.
- Collaboration & Practical Application ¨C Work in multidisciplinary teams on real-world projects.
Course Description
This course provides an in-depth exploration of the principles, techniques, and applications of three-dimensional integrated circuit (3D IC) packaging. 3D IC packaging is a cutting-edge technology that enables the stacking of multiple integrated circuits (ICs) within a single package, offering numerous advantages in terms of performance, power efficiency, and form factor.
The course begins with an introduction to the fundamentals of IC packaging, including various packaging technologies and their evolution. It then delves into the concepts and challenges associated with 3D IC packaging. Students will gain a comprehensive understanding of the design considerations, fabrication processes, and assembly techniques employed in 3D IC packaging. The course also covers topics like EMIR and has comprehensive physical verification in the areas of chip stacking.
Prerequisites / Skills Needed
Some familiarity with material science principles and a fundamental knowledge of semiconductor manufacturing processes.
Additional Information
AI* - This course integrates AI by highlighting the hardware advances¡ªsuch as hybrid bonding, high-density interconnects, and other enabling technologies¡ªrequired to support high-speed data transmission for modern AI systems.
- Flexible Attend in person or via Zoom at scheduled times.
| Date | Start Time | End Time | Meeting Type | Location |
|---|---|---|---|---|
| Sat, 01-24-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 01-31-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 02-07-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 02-14-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 02-21-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 02-28-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 03-07-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 03-14-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 03-21-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
| Sat, 03-28-2026 | 9:00am | 12:00pm | Flexible | SANTA CLARA / REMOTE |
This class meets simultaneously in a classroom and remotely via Zoom. Students are expected to attend and participate in the course, either in-person or remotely, during the days and times that are specified on the course schedule. Students attending remotely are also strongly encouraged to have their cameras on to get the most out of the remote learning experience.
To see all meeting dates, click "Full Schedule" below.
You will be granted access in Canvas to your course site and course materials approximately 24 hours prior to the published start date of the course.
Required Tools & Materials: 3D IC Synopsys (no cost to students)
Recommended Text(s):
3D IC Stacking Technology; Wu, Kumar and Ramaswami; McGraw Hill Professional, 2011. ISBN: 9780071741965
Wafer Level 3-D ICs Process Technology (Integrated Circuits and Systems) 2009th Edition, Chuan Seng Tan (Editor), Ronald J. Gutmann (Editor), L. Rafael Reif (Editor), Springer, ISBN: 978-0387765327. This book focuses on foundry-based process technology that enables the fabrication of 3-D ICs. The core of the book discusses the technology platform for pre-packaging wafer lever 3-D Ics.
3D Integration for VLSI Systems, 1st Edition, Chuan Seng Tan (Editor), Kuan-Neng Chen (Editor), Steven J. Koester (Editor), Jenny Stanford Publishing, ISBN: 978-9814303811. Three-dimensional (3D) integration is identified as a possible avenue for continuous performance growth in integrated circuits (IC) as the conventional scaling approach is faced with unprecedented challenges in fundamental and economic limits.
Electromigration in Thin Films and Electronic Devices: Materials and Reliability, Choong-Un Kim, Ed., 2011, Woodhead Publishing, ISBN: 9780857093752. This book provides a comprehensive overview of the materials science and reliability issues related to electromigration in thin films and electronic devices.
This course applies to these programs: